This part of IEC 61967 provides general information and definitions on the measurement of 
conducted and radiated electromagnetic disturbances from integrated circuits. It also provides 
a description of measurement conditions, test equipment and set-up as well as the test 
procedures and content of the test reports. Test method comparison tables are included in 
Annex A to assist in selecting the appropriate measurement method(s). 
The object of this document is to describe general conditions in order to establish a uniform 
testing environment and to obtain a quantitative measure of RF disturbances from integrated 
circuits (IC). Critical parameters that are expected to influence the test results are described. 
Deviations from this document are noted explicitly in the individual test report. The 
measurement results can be used for comparison or other purposes. 
Measurement of the voltage and current of conducted RF emissions or radiated RF 
disturbances, coming from an integrated circuit under controlled conditions, yields information 
about the potential for RF disturbances in an application of the integrated circuit. 
The applicable frequency range is described in each part of IEC 61967.dition 2.0 2018-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits – Measurement of electromagnetic emissions – Part 1: General conditions and definitions Circuits intégrés – Mesure des émissions électromagnétiques – Partie 1: Conditions générales et définitions IEC 61967-1:2018-12(en-fr) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright ？ 2018 IEC, Geneva, Switzerland All rights reserve