首頁 > 標(biāo)準(zhǔn)下載>IEC 60749-5-2017 半導(dǎo)體設(shè)備--機(jī)械和氣候試驗(yàn)方法--第5部分:穩(wěn)定狀態(tài)溫度濕度偏重生命試驗(yàn) Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test免費(fèi)下載

IEC 60749-5-2017 半導(dǎo)體設(shè)備--機(jī)械和氣候試驗(yàn)方法--第5部分:穩(wěn)定狀態(tài)溫度濕度偏重生命試驗(yàn) Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

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標(biāo)準(zhǔn)編號：IEC 60749-5-2017
標(biāo)準(zhǔn)狀態(tài)：現(xiàn)行
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This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the
purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid
environments.
This test method is considered destructive.dition 2.0 2017-04 INTERNATIONAL STANDARD Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test IEC 60749-5:2017-04(en) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright ？ 2017 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any mean

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