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Electrical resistivity and structural heredity of hypereutectic Al-Si alloy melt Electrical resistivity and structural heredity of hypereutectic Al-Si alloy melt

Electrical resistivity and structural heredity of hypereutectic Al-Si alloy melt

  • 期刊名字:中國有色金屬學(xué)會會刊
  • 文件大小:
  • 論文作者:李培杰,熊玉華,張燕飛,曾大本
  • 作者單位:Department of Mechanical Engineering
  • 更新時間:2023-02-08
  • 下載次數(shù):
論文簡介

The variation rule of the sensitive physical properties of Al-16%Si alloy melt was studied. The results show that within a certain temperature range, the electrical resistivity of Al-16%Si alloy melt changes abruptly in the forms of inflection points or platforms, which is ascribed to the changes in the internal microstructure of the melt. Based on this rule, the variation characteristics of microstructure can be revealed. When remelting and overheating Al-16%Si alloy to 1050℃, the hereditary effects of different original structure on solidification structure after remelting can be eliminated, which can provide scientific foundation for properly controlling the hereditary factors transmitting the structural information of melt.

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